Nanometrics Caliper Q300 Overlay Measurement
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Nanometrics Caliper Q300 Overlay Measurement

商家设备
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Metrology

类型

12

晶片尺寸

基本信息

  • 型号:Caliper Q300
  • 类型:Metrology
  • 晶片尺寸:12
  • 设备数量:1
  • 销售状态:待出售

设备描述

Robotic pick and place wafer transport with two FOUPs Optics module with variable magnification High Resolution X,Y,Z & Theta Stage sortware controlled incorporating DSF Autofocus Programmable Bandwidth Illumination system Automated Pattern Recognition Vibration Isolation Table Fully I300I && GEM/MSEM compliant GUI and Analysis package running under Lenux File sharing by LAN

实拍照片

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